大功率器件老化測試系統

Accel-RF所推出的射頻特性測試平臺,針對大功率器件的直流,射頻,溫度等特性進行加速老化測試。

大功率器件老化測試系統

產品特色:

A single system to simultaneously

–?Determine life expectancy of compound semiconductor components

–?Characterize components during test to show RF and DC degradation

Multidimensional Dynamic Testing

–?Automatically perform 3-temperature life tests

–?Automatically characterize components

Stimulate each DUT with …

–?RF

??Independent RF drive level for each DUT

??Frequency ranges to 18 GHz @ up to 10W

–?DC

??Two independent bias sources (up to 100V, 3A @ 60W max)

??Bias can be constant voltage or constant current sources

–?Temperature

??Independent “Channe”l or “Surface” temp control for each DUT

??+50oC to +250oC